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Surface Characterization for Computer Disc Wafers

Surface Characterization for Computer Disc Wafers

by John C. Stover

1999Semiconductor wafersSurface roughnessAnalysisCongressesMeasurement
0.0
Open Library
Open Library

Themes & subjects

Semiconductor wafersSurface roughnessAnalysisCongressesMeasurementFlatness measurement
First published 1999

Author

John C. Stover

First published

1999

Pages

136

Read time

≈ 3h

Editions

2

Language

English

Publisher

SPIE

ISBN

9780819430892

Where to buy

TR
Amazon Bookshop

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