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Materials Reliability in Microelectronics V (Symposium Proceedings Series; Volume 391)

Materials Reliability in Microelectronics V (Symposium Proceedings Series; Volume 391)

by A. S. Oates

ReliabilityCongressesMicrostructureMaterialsTesting
0.0
Open Library
Open Library

Themes & subjects

ReliabilityCongressesMicrostructureMaterialsTestingMicroelectronics

Author

A. S. Oates

Pages

523

Read time

≈ 13h

Editions

2

Language

English

Publisher

Materials Research Society

ISBN

9781558992948

Where to buy

TR
Amazon Bookshop

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